7 September 2011 Alignment and characterization of high uniformity imaging spectrometers
Author Affiliations +
Proceedings Volume 8158, Imaging Spectrometry XVI; 81580J (2011); doi: 10.1117/12.892798
Event: SPIE Optical Engineering + Applications, 2011, San Diego, California, United States
Imaging spectrometers require precise adjustments, in some cases at the sub-micrometer level, in order to achieve a uniform response over both the spectral and spatial dimensions. We describe a set of measurement techniques and their corresponding alignment adjustments to achieve the 95% or higher uniformity specifications required for Earthobserving imaging spectrometers. The methods are illustrated with measurements from the Next Generation Imaging Spectrometer system that has been built at the Jet Propulsion Laboratory, California Institute of Technology, under contract with the National Aeronautics and Space Administration.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Holly A. Bender, Pantazis Mouroulis, Michael L. Eastwood, Robert O. Green, Sven Geier, Eric B. Hochberg, "Alignment and characterization of high uniformity imaging spectrometers", Proc. SPIE 8158, Imaging Spectrometry XVI, 81580J (7 September 2011); doi: 10.1117/12.892798; https://doi.org/10.1117/12.892798


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