Paper
31 August 2011 Self-trapped holes in glassy silica: basic science with relevance to photonics in space
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Abstract
The natures of most radiation-induced point defects in amorphous silicon dioxide (a-SiO2) are well known on the basis of 55 years of electron spin resonance (ESR) and optical studies of pure and doped silica in bulk, thin-film, and fiberoptic forms. The self-trapped holes (STHs), discovered only in 1989, appear to be responsible for most radiationinduced red/near-IR optical absorption in silica-based photonics. However, accelerated testing of a-SiO2-based devices slated for space applications must take into account the highly supralinear dependence of the initial STH creation rate on ionizing dose rate...and the possibility to permanently reduce the created numbers of STHs by high-dose pre-irradiation.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David L. Griscom "Self-trapped holes in glassy silica: basic science with relevance to photonics in space", Proc. SPIE 8164, Nanophotonics and Macrophotonics for Space Environments V, 816405 (31 August 2011); https://doi.org/10.1117/12.892760
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KEYWORDS
Silica

Optical fibers

Glasses

Fractal analysis

Absorption

Oxygen

Silicon

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