Investigation of manufacturing processes by numerical sensitivity analysis

Olivier Vasseur; Michel Cathelinaud

doi:10.1117/12.896785

3 October 2011 Investigation of manufacturing processes by numerical sensitivity analysis

Olivier Vasseur, Michel Cathelinaud

Proceedings Volume 8168, Advances in Optical Thin Films IV; 81680A (2011) https://doi.org/10.1117/12.896785
Event: SPIE Optical Systems Design, 2011, Marseille, France

Abstract

During the manufacturing of optical coatings, errors in refractive index values or in thickness values of each layer of the coating can induce dramatic consequences on the desired optical properties. Global numerical sensitivity analyses using space filling designs and metamodels were applied in the case of the influence study of different errors on optical filter characteristics to determine the most critical interactions of layers. We propose to use space filling designs to assess, by computer experiments, the sensitivity of optical filters to the simultaneous errors in the refractive index values and thickness values. In this study, the principal characteristics of space filling designs are presented and are compared to random designs. This comparison allows us to identify the best types of space filling designs to conduct sensitivity analysis with few computer runs. We will present the first results concerning the global sensitivity analysis of different coatings in the case of simultaneous errors in refractive index values and in thickness values. We consider for this study two monitoring techniques: a quartz monitoring and an optical monitoring. By this way, we will highlight the influence of correlated errors on the most critical interactions classification and give a different perspective to these monitoring techniques. In conclusion, this computational study gives clues to the understanding of error propagation in manufacturing processes and points out the most critical interactions in coatings to improve the robustness of optical coatings and to reduce the production costs.

Citation Download Citation

Olivier Vasseur and Michel Cathelinaud "Investigation of manufacturing processes by numerical sensitivity analysis", Proc. SPIE 8168, Advances in Optical Thin Films IV, 81680A (3 October 2011); https://doi.org/10.1117/12.896785

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available