Paper
4 October 2011 Resonances determination in microstructured films embedded in multilayered stacks
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Abstract
Our approach consists in finding the eigenmodes and the complex eigenfrequencies of structures using a finite element method (FEM), that allows us to study mono- or bi-periodic gratings with a maximum versatility : complex shaped patterns, with anisotropic and graded index material, under oblique incidence and arbitrary polarization. In order to validate our method, we illustrate an example of a four layer dielectric slab, and compare the results with a specific method that we have called tetrachotomy, which gives us numerically the poles of the reflection coefficient (which corresponds to the eigenfrequencies of the structure). To illustrate our method, we show the eigenvalues of one- and two-dimensional gratings.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Benjamin Vial, Mireille Commandré, Frédéric Zolla, André Nicolet, and Stephane Tisserand "Resonances determination in microstructured films embedded in multilayered stacks", Proc. SPIE 8168, Advances in Optical Thin Films IV, 816822 (4 October 2011); https://doi.org/10.1117/12.897347
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KEYWORDS
Finite element methods

Diffraction

Diffraction gratings

Transmittance

Dielectrics

Multilayers

Silica

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