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Manufacturing, testing, and metrology of axi-symmetric circular phase masks for stellar coronagraphy
Multimodal scattering facilities and modelization tools for a comprehensive investigation of optical coatings
Impact of surface roughness on the scatter losses and the scattering distribution of surfaces and thin film coatings
Two-dimensional thickness measurement of a dielectric thin layer on a metal by use of surface-plasmon-resonance-based ellipsometry
Absolute calibration of three reference flats based on an iterative algorithm: study and implementation