Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV)

C. Ruiz de Galarreta Fanjul; A. Philippon; J.-C. Vial; J.-P. Maillard; T. Appourchaux

doi:10.1117/12.896714

21 September 2011 Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV)

C. Ruiz de Galarreta Fanjul, A. Philippon, J.-C. Vial, J.-P. Maillard, T. Appourchaux

Proceedings Volume 8169, Optical Fabrication, Testing, and Metrology IV; 816907 (2011) https://doi.org/10.1117/12.896714
Event: SPIE Optical Systems Design, 2011, Marseille, France

Abstract

Imaging Fourier Transform Spectrometer working in the far UV (IFTSUV) may be the technical solution to answer many unsolved problems concerning the physics of the solar outer atmosphere. The VUV domain highly constrains the instruments design and performances as it demands a high optics surface quality and an accurate metrology to preserve IFTSUV spectral precision and Signal to Noise Ratio (SNR). We present the advancements on the specification of a metrology system, meeting the predicted performance requirements of an IFTSUV.

Citation Download Citation

C. Ruiz de Galarreta Fanjul, A. Philippon, J.-C. Vial, J.-P. Maillard, and T. Appourchaux "Metrology for an imaging Fourier transform spectrometer working in the far-UV (IFTSUV)", Proc. SPIE 8169, Optical Fabrication, Testing, and Metrology IV, 816907 (21 September 2011); https://doi.org/10.1117/12.896714

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