Reversible Phase Change Sb-Te Films For Optical Disk

Hiroki Yamazaki; Shogo Yagi; Susumu Fujimori; Nobuhiro Funakoshi

doi:10.1117/12.978892

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1 January 1987 Reversible Phase Change Sb-Te Films For Optical Disk

Hiroki Yamazaki, Shogo Yagi, Susumu Fujimori, Nobuhiro Funakoshi

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Proceedings Volume 0818, Current Developments in Optical Engineering II; (1987) https://doi.org/10.1117/12.978892
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

Methods for testing amorphous life, erasing rate and amorphizing sensitivity in situ are presented. SbxTe1-x films are characterized using these methods and it is shown that the fastest erasing rate and the longest amorphous life can be achieved at almost the same compositional value of x = 0.4. Sb-Te disk properties are studied with a one-beam head whose focused beam diameter is 1.4 μm. The carrier-to-noise ratio for 1.0 μm diameter amorphous marks recorded at a mark pitch of 2.5 pm is 47 dB. An investigation of erasing performance with the circularly focused beam revealed that the crystallization rate is fastest at a temperature comparatively lower than the melting temperature.

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Hiroki Yamazaki, Shogo Yagi, Susumu Fujimori, and Nobuhiro Funakoshi "Reversible Phase Change Sb-Te Films For Optical Disk", Proc. SPIE 0818, Current Developments in Optical Engineering II, (1 January 1987); https://doi.org/10.1117/12.978892

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