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1 January 1987 Reversible Phase Change Sb-Te Films For Optical Disk
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Methods for testing amorphous life, erasing rate and amorphizing sensitivity in situ are presented. SbxTe1-x films are characterized using these methods and it is shown that the fastest erasing rate and the longest amorphous life can be achieved at almost the same compositional value of x = 0.4. Sb-Te disk properties are studied with a one-beam head whose focused beam diameter is 1.4 μm. The carrier-to-noise ratio for 1.0 μm diameter amorphous marks recorded at a mark pitch of 2.5 pm is 47 dB. An investigation of erasing performance with the circularly focused beam revealed that the crystallization rate is fastest at a temperature comparatively lower than the melting temperature.
© (1987) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Hiroki Yamazaki, Shogo Yagi, Susumu Fujimori, and Nobuhiro Funakoshi "Reversible Phase Change Sb-Te Films For Optical Disk", Proc. SPIE 0818, Current Developments in Optical Engineering II, (1 January 1987);

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