Infrared Transparencies (Thermoscenes) For Simulation Of Infrared Scenes As A Tool To Improve Flir Testing

S. Ghilai; U. Gera; Dario Cabib; Alex Lapin; Y. Liran

doi:10.1117/12.941804

10 November 1987 Infrared Transparencies (Thermoscenes) For Simulation Of Infrared Scenes As A Tool To Improve Flir Testing

S. Ghilai, U. Gera, Dario Cabib, Alex Lapin, Y. Liran

Author Affiliations +

Proceedings Volume 0819, Infrared Technology XIII; (1987) https://doi.org/10.1117/12.941804
Event: 31st Annual Technical Symposium on Optical and Optoelectronic Applied Sciences and Engineering, 1987, San Diego, CA, United States

Abstract

The Minimum Resolvable Temperature Difference (MRTD) is a classic performance parameter, used by manufacturers of thermal imaging systems (FLIR's) in the characterization and final testing of such devices. The Johnson criterion [1] relates the MRTD to practical characteristics, such as the ability of the FLIR to resolve objects, as function of distance. However, the MRTD measurement suffers from several drawbacks,e.g. i) it is subjective, ii) it fails to account for complex real life situations, such as background and foreground clutter, object shape and non-uniformities of temperature and emissivity. This paper describes a new type of transparency which has been developed to simulate real infrared scenes. The transparency consists of a half-tone mesh of variable size holes which, when placed in front of a blackbody, simulates a two dimensional radiant emittance pattern. The pattern itself can be generated from a thermal image of any real object as seen by a high performance FLIR, from an artificially computer generated image, or from a combination of the two. Examples of thermoscenes and measurements of radiation distribution over a simple pattern are shown. Potential applications of the thermoscenes are also discussed.

Citation Download Citation

S. Ghilai, U. Gera, Dario Cabib, Alex Lapin, and Y. Liran "Infrared Transparencies (Thermoscenes) For Simulation Of Infrared Scenes As A Tool To Improve Flir Testing", Proc. SPIE 0819, Infrared Technology XIII, (10 November 1987); https://doi.org/10.1117/12.941804

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available