As2/Ga flux ratios and low-temperature annealing dependence of Ga1-xMnxAs films by x-ray absorption spectroscopy

X. C. Cao; G. S. Yao; L. X. Zhang; L. W. Wang; Y. Q. Lv; Z. Y. Peng

doi:10.1117/12.899858

8 September 2011 As₂/Ga flux ratios and low-temperature annealing dependence of Ga_1-xMn_xAs films by x-ray absorption spectroscopy

X. C. Cao, G. S. Yao, L. X. Zhang, L. W. Wang, Y. Q. Lv, Z. Y. Peng

Author Affiliations +

Proceedings Volume 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications; 81931F (2011) https://doi.org/10.1117/12.899858
Event: International Symposium on Photoelectronic Detection and Imaging 2011, 2011, Beijing, China

Abstract

We have measured room temperature x-ray absorption spectroscopy (XAS) at the Mn L_2,3edges on ferromagnetic Ga_1-xMn_xAs films prepared under different As₂/Ga flux ratios. A growth condition relative energy shift (ΔE) at L₂ peak was observed, the results suggest that the formation of antiferromagnetic Mn-As complex under As-rich growth conditions and the energy shift can be weakened even eliminated by post-growth low temperature (LT) annealing. The intensity of XAS spectrum was promoted after post-growth annealing, and the effect of annealing was also influenced by growth conditions.

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X. C. Cao, G. S. Yao, L. X. Zhang, L. W. Wang, Y. Q. Lv, and Z. Y. Peng "As₂/Ga flux ratios and low-temperature annealing dependence of Ga_1-xMn_xAs films by x-ray absorption spectroscopy", Proc. SPIE 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications, 81931F (8 September 2011); https://doi.org/10.1117/12.899858

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