The accelerated vacuum life test research of Dewar

Yani Zhang; Xiaokun Wang; Sangen Zhu; Haimei Gong

doi:10.1117/12.900284

8 September 2011 The accelerated vacuum life test research of Dewar

Yani Zhang, Xiaokun Wang, Sangen Zhu, Haimei Gong

Proceedings Volume 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications; 819323 (2011) https://doi.org/10.1117/12.900284
Event: International Symposium on Photoelectronic Detection and Imaging 2011, 2011, Beijing, China

Abstract

The Dewar package is one important way for infrared focal plane detector's application. Vacuum life is one of pivotal technologic parameter for infrared detector Dewar assembly. It is important to estimate the vacuum life of Dewar in room temperature fleetly and truly. The accelerated vacuum life test is a good way to shorten test time. The statistical and analytical way of test data to estimate distribution of Dewar vacuum life that is confirmed. Through test accelerated factor, vacuum life of Dewar in room temperature can be gained.

Citation Download Citation

Yani Zhang, Xiaokun Wang, Sangen Zhu, and Haimei Gong "The accelerated vacuum life test research of Dewar", Proc. SPIE 8193, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Infrared Imaging and Applications, 819323 (8 September 2011); https://doi.org/10.1117/12.900284

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