Processing and analyzing transmission electron microscope images of nanocrystals

Xiao-hong Yang

doi:10.1117/12.895275

18 August 2011 Processing and analyzing transmission electron microscope images of nanocrystals

Xiao-hong Yang

Proceedings Volume 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications; 819408 (2011) https://doi.org/10.1117/12.895275
Event: International Symposium on Photoelectronic Detection and Imaging 2011, 2011, Beijing, China

Abstract

Image processing technology is used to process the transmission electron microscope (TEM) pictures for improving the definition of the TEM images, giving prominence to the characteristics of crystal materials and obtaining useful crystal structure information. The language we have used is Matlab.7.0. To improve the articulation of the TEM images, different method is used according to the characteristics of the pictures, including contrast self adapting histogram homogenizing, filter noises and so on. Fourier transformation is used for analyzing the structure of nanocrystal materials. Edge detection method is used to enhance the granular character. Detecting the intensity distribution method is used for distinguishing the nanocrystal tube and nanocrystal granule. It can also be used to analyze decentrality and homogeneity of the nanocrystals granular. In order to measure the dimension of the nanocrystal more precisely, we distinguish the points with larger changes in grey level by using the function "edge".

Citation Download Citation

Xiao-hong Yang "Processing and analyzing transmission electron microscope images of nanocrystals", Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 819408 (18 August 2011); https://doi.org/10.1117/12.895275

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