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18 August 2011 Temporal differential CMOS image sensor for low-light and high-speed applications
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Abstract
A new structure of pixels of CMOS image sensors is presented in this article. With multiple layers of metal, it is possible to separate control pins of adjacent pixels. These separated control pins make it possible to overlap exposure time of these pixels. After recovering information with temporal difference from the raw data of overlapping exposure, the temporal resolution can be smaller than the exposure time. This kind of pixels can be used in low-light or high-speed applications where the choices of exposure time is limited.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Ning Guan, Xu Zhang, Zan Dong, Wei Wang, Yun Gui, Jianqiang Han, Yuan Wang, Beiju Huang, and Hongda Chen "Temporal differential CMOS image sensor for low-light and high-speed applications", Proc. SPIE 8194, International Symposium on Photoelectronic Detection and Imaging 2011: Advances in Imaging Detectors and Applications, 81942F (18 August 2011); https://doi.org/10.1117/12.900682
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