5 December 2011 Precision measurement facility of mid-infrared spectral emissivity measurement
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Proceedings Volume 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments; 819714 (2011) https://doi.org/10.1117/12.905503
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China
Abstract
Based on Fourier infrared spectrometer, the mid-infrared normal spectral emissivity measurement device with high accuracy was developed in Spectrophotometry Laboratory, National Institute of Metrology, China. It was composed of Fourier infrared spectrometer, black body, heater and the auxiliary optical components. It can work at 100 to 450°C with heating function and can work at up to 1100°C only for self-heating materials or systems. The measurement wavelength range covers the whole middle infrared light 2.5-25um, and the measurement uncertainty is better than 2%(k=2) at any measurement temperature point for self-heating materials or systems.
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Guojin Feng, Guojin Feng, Tingliang Guo, Tingliang Guo, "Precision measurement facility of mid-infrared spectral emissivity measurement", Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 819714 (5 December 2011); doi: 10.1117/12.905503; https://doi.org/10.1117/12.905503
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