5 December 2011 2000W high beam quality diode laser for direct materials processing
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Proceedings Volume 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments; 81971J (2011) https://doi.org/10.1117/12.916698
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China
Abstract
This article describes high beam quality and kilowatt-class diode laser system for direct materials processing, using optical design software ZEMAX® to simulate the diode laser optical path, including the beam shaping, collimation, coupling, focus, etc.. In the experiment, the diode laser stack of 808nm and the diode laser stack of 915nm were used for the wavelength coupling, which were built vertical stacks up to 16 bars. The threshold current of the stack is 6.4A, the operating current is 85A and the output power is 1280W. Through experiments, after collimating the diode laser beam with micro-lenses, the fast axis BPP of the stack is less than 60mm·mrad, and the slow-axis BPP of the stack is less than 75mm·mrad. After shaping the laser beam and improving the beam quality, the fast axis BPP of the stack is still 60mm·mrad, and the slow-axis BPP of the stack is less than 19mm·mrad. After wavelength coupling and focusing, ultimately the power of 2150W was obtained, focal spot size of 1.5mm * 1.2mm with focal length 300mm. The laser power density is 1.2×105W/cm2, and that can be used for metal remelting, alloying, cladding and welding. The total optical coupling conversion efficiency is 84%, and the total electrical - optical conversion efficiency is 50%.
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Wen-bin Qin, Wen-bin Qin, You-qiang Liu, You-qiang Liu, Yin-hua Cao, Yin-hua Cao, Jing Gao, Jing Gao, Fei Pan, Fei Pan, Zhi-yong Wang, Zhi-yong Wang, } "2000W high beam quality diode laser for direct materials processing", Proc. SPIE 8197, 2011 International Conference on Optical Instruments and Technology: Optical Systems and Modern Optoelectronic Instruments, 81971J (5 December 2011); doi: 10.1117/12.916698; https://doi.org/10.1117/12.916698
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