5 December 2011 Application of frequency spectrum analysis in measuring multi-vibrations by using POTDR
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Proceedings Volume 8198, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration; 819808 (2011) https://doi.org/10.1117/12.910376
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China
Abstract
The technology of Polarization Optical Time Domain Reflectometer (POTDR) can be used to obtain the external events' information by measuring the change of state of polarization (SOP) of the Rayleigh backscattering in fiber. When the fiber is disturbed at two different positions simultaneously, we analyze the frequency spectrums of the change of Rayleigh backscattering light which are obtained by POTDR theoretically for ideal fiber, and by numerical simulation for single mode fibers. We find that the frequency spectrums between the first and second events contain the first vibration's frequency and its frequency multiplication. The frequency components of the spectrums after the second event are the linear combination of the first and the second events' frequencies. So we can obtain the location and the frequency information of the two events by analyzing the frequency spectrums. In addition, the frequency distribution in the frequency spectrums from different positions are different because of the different initial SOPs at different positions. So all the actual frequency information can not be obtained from only one frequency spectrum. We add up the frequency spectrums from the positions within a beat length to obtain the perturbation's frequency and the method can reduce the misdiagnosis rate because the sum of the frequency spectrums contains all the initial SOP within a beat length.
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Xiangchuan Wang, Xiangchuan Wang, Xuping Zhang, Xuping Zhang, Feng Wang, Feng Wang, Mengmeng Chen, Mengmeng Chen, Cunlei Li, Cunlei Li, } "Application of frequency spectrum analysis in measuring multi-vibrations by using POTDR", Proc. SPIE 8198, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Devices and Integration, 819808 (5 December 2011); doi: 10.1117/12.910376; https://doi.org/10.1117/12.910376
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