PROCEEDINGS VOLUME 8200
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY (OIT2011) | 6-9 NOVEMBER 2011
2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology
IN THIS VOLUME

7 Sessions, 58 Papers, 0 Presentations
Session 1  (9)
Session 2  (4)
Session 3  (4)
Session 4  (4)
Session 5  (3)
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY (OIT2011)
6-9 November 2011
Beijing, Beijing, China
Front Matter: Volume 8200
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820001 (1 December 2011); doi: 10.1117/12.921662
Session 1
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820002 (29 November 2011); doi: 10.1117/12.902981
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820003 (29 November 2011); doi: 10.1117/12.903668
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820004 (29 November 2011); doi: 10.1117/12.904756
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820005 (29 November 2011); doi: 10.1117/12.904669
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820006 (29 November 2011); doi: 10.1117/12.904656
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820007 (29 November 2011); doi: 10.1117/12.904671
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820008 (29 November 2011); doi: 10.1117/12.904860
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820009 (29 November 2011); doi: 10.1117/12.907080
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000A (29 November 2011); doi: 10.1117/12.916689
Session 2
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000B (29 November 2011); doi: 10.1117/12.916690
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000C (29 November 2011); doi: 10.1117/12.907324
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000D (29 November 2011); doi: 10.1117/12.907347
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000E (29 November 2011); doi: 10.1117/12.904862
Session 3
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000F (29 November 2011); doi: 10.1117/12.906556
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000G (29 November 2011); doi: 10.1117/12.906570
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000H (29 November 2011); doi: 10.1117/12.904843
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000I (29 November 2011); doi: 10.1117/12.904846
Session 4
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000J (29 November 2011); doi: 10.1117/12.903902
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000K (29 November 2011); doi: 10.1117/12.903709
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000L (29 November 2011); doi: 10.1117/12.904882
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000M (29 November 2011); doi: 10.1117/12.906667
Session 5
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000N (29 November 2011); doi: 10.1117/12.904831
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000O (29 November 2011); doi: 10.1117/12.904958
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000P (29 November 2011); doi: 10.1117/12.904910
Poster Session
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000Q (29 November 2011); doi: 10.1117/12.902739
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000R (29 November 2011); doi: 10.1117/12.903444
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000S (29 November 2011); doi: 10.1117/12.903779
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000T (29 November 2011); doi: 10.1117/12.903780
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000U (29 November 2011); doi: 10.1117/12.903843
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000V (29 November 2011); doi: 10.1117/12.904078
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000W (29 November 2011); doi: 10.1117/12.904345
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000X (29 November 2011); doi: 10.1117/12.904352
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000Y (29 November 2011); doi: 10.1117/12.904623
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000Z (29 November 2011); doi: 10.1117/12.904626
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820010 (29 November 2011); doi: 10.1117/12.904647
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820011 (29 November 2011); doi: 10.1117/12.904678
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820012 (29 November 2011); doi: 10.1117/12.904785
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820013 (29 November 2011); doi: 10.1117/12.904786
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820014 (29 November 2011); doi: 10.1117/12.904805
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820015 (29 November 2011); doi: 10.1117/12.904809
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820016 (29 November 2011); doi: 10.1117/12.904812
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820017 (29 November 2011); doi: 10.1117/12.904837
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 820018 (29 November 2011); doi: 10.1117/12.904877
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001A (29 November 2011); doi: 10.1117/12.905013
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001B (29 November 2011); doi: 10.1117/12.905885
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001C (29 November 2011); doi: 10.1117/12.906224
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001D (29 November 2011); doi: 10.1117/12.906528
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001E (29 November 2011); doi: 10.1117/12.906691
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001F (29 November 2011); doi: 10.1117/12.906699
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001G (29 November 2011); doi: 10.1117/12.907036
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001H (29 November 2011); doi: 10.1117/12.907052
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001I (29 November 2011); doi: 10.1117/12.907217
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001J (29 November 2011); doi: 10.1117/12.907235
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001K (29 November 2011); doi: 10.1117/12.907279
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001L (29 November 2011); doi: 10.1117/12.910623
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001M (29 November 2011); doi: 10.1117/12.919796
Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82001N (29 November 2011); doi: 10.1117/12.920629
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