28 November 2011 Analysis of vibration influence on synthetic aperture lidar imaging
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Proceedings Volume 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology; 82000W (2011) https://doi.org/10.1117/12.904345
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China
Abstract
Based on the theory of the coherent detection of laser, a signal model of Synthetic Aperture Lidar is set up. As the wavelength of laser light from the SAL is shorter than that of microwave from the SAR about several times, considering the parts of Taylor Series must be enough, compute and analysis the influence of vibration error on the phase of SAL echo signal. In order to validate the signal model and the theory computation, numerical simulation on a strip-mode is carried out. On the reference of the national military standard for environment, in the condition of the frequency below 500MHz, simulate and show the influence of the vibration parameters such as amplitude, frequency or initial phase on the SAL imaging, and the image with the vibration of ideal point target is given. The simulation results show that the influence of vibration on the azimuth resolution is severity, but that on the range resolution is trivial, this is by the reason of the period of vibration is different from the period of laser pulse, and in one laser pulse period, the vibration is considered immovability, therefore the influence on the range compress is nonentity, and the range resolution is steady. In addition, simulate the condition of the same amplitude and frequency but different initial phase, find that the influence of different initial phase on SAL imaging is different and serious, as the initial phase is stochastic, the influence of vibration on SAL imaging is erratically.
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Xu-guang Lv, Xu-guang Lv, Shi-qi Hao, Shi-qi Hao, Jiao-feng Leng, Jiao-feng Leng, } "Analysis of vibration influence on synthetic aperture lidar imaging", Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000W (28 November 2011); doi: 10.1117/12.904345; https://doi.org/10.1117/12.904345
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