28 November 2011 Lifetime computing algorithms based on exponential pattern retrieve and polynomial fitting in fluorescence lifetime imaging microscopy
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Proceedings Volume 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology; 82000X (2011) https://doi.org/10.1117/12.904352
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China
Abstract
How to simulate the decay pattern is crucial during lifetime inversion while utilizing intensity images acquired at increasing delays in time gated fluorescence lifetime imaging microscopy (FLIM) method. A relatively novel understanding of fluorescence decay pattern theory and stimulation algorithms of time gated FLIM method have been analyzed in this paper comprehensively. Main lifetime computing algorithms can be classified as exponential pattern retrieve and polynomial fitting procedure. Especially, a novel lifetime computing method based on bi-exponential decay has been discussed. In experiment, we have validated the proposed algorithms utilizing synthetic images. Performances like calculating precision and computing speed of the algorithms above have also been compared.
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Chao Liu, Chao Liu, Yan Zhou, Yan Zhou, Xinwei Wang, Xinwei Wang, Yuliang Liu, Yuliang Liu, } "Lifetime computing algorithms based on exponential pattern retrieve and polynomial fitting in fluorescence lifetime imaging microscopy", Proc. SPIE 8200, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Imaging and Processing Technology, 82000X (28 November 2011); doi: 10.1117/12.904352; https://doi.org/10.1117/12.904352
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