PROCEEDINGS VOLUME 8201
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY (OIT2011) | 6-9 NOVEMBER 2011
2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
IN THIS VOLUME

10 Sessions, 83 Papers, 0 Presentations
Session 1  (4)
Session 2  (3)
Session 3  (4)
Session 4  (3)
Session 5  (5)
Session 6  (3)
Session 7  (2)
Session 8  (2)
INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY (OIT2011)
6-9 November 2011
Beijing, Beijing, China
Front Matter: Volume 8201
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820101 (19 December 2011); doi: 10.1117/12.921664
Session 1
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820102 (30 November 2011); doi: 10.1117/12.904722
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820103 (30 November 2011); doi: 10.1117/12.906274
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820104 (30 November 2011); doi: 10.1117/12.904857
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820105 (30 November 2011); doi: 10.1117/12.904909
Session 2
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820107 (30 November 2011); doi: 10.1117/12.905727
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820109 (30 November 2011); doi: 10.1117/12.906647
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010A (30 November 2011); doi: 10.1117/12.906943
Session 3
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010B (30 November 2011); doi: 10.1117/12.906564
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010C (30 November 2011); doi: 10.1117/12.904661
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010D (30 November 2011); doi: 10.1117/12.904464
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010E (30 November 2011); doi: 10.1117/12.903955
Session 4
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010F (30 November 2011); doi: 10.1117/12.904895
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010G (30 November 2011); doi: 10.1117/12.907158
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010H (30 November 2011); doi: 10.1117/12.910065
Session 5
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010J (30 November 2011); doi: 10.1117/12.910102
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010K (30 November 2011); doi: 10.1117/12.903713
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010L (30 November 2011); doi: 10.1117/12.904083
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010M (30 November 2011); doi: 10.1117/12.905002
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010N (30 November 2011); doi: 10.1117/12.905339
Session 6
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010O (30 November 2011); doi: 10.1117/12.906084
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010P (30 November 2011); doi: 10.1117/12.907063
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010Q (30 November 2011); doi: 10.1117/12.916691
Session 7
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010S (30 November 2011); doi: 10.1117/12.904665
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010T (30 November 2011); doi: 10.1117/12.904666
Session 8
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010V (30 November 2011); doi: 10.1117/12.904704
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010W (30 November 2011); doi: 10.1117/12.906502
Poster Session
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010Y (30 November 2011); doi: 10.1117/12.902978
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010Z (30 November 2011); doi: 10.1117/12.903431
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820110 (30 November 2011); doi: 10.1117/12.903941
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820112 (30 November 2011); doi: 10.1117/12.904182
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820113 (30 November 2011); doi: 10.1117/12.904261
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820114 (30 November 2011); doi: 10.1117/12.913047
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820115 (30 November 2011); doi: 10.1117/12.904632
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820116 (30 November 2011); doi: 10.1117/12.904710
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820117 (30 November 2011); doi: 10.1117/12.904717
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820118 (30 November 2011); doi: 10.1117/12.904732
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820119 (30 November 2011); doi: 10.1117/12.904736
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011A (30 November 2011); doi: 10.1117/12.904737
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011B (30 November 2011); doi: 10.1117/12.904759
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011C (30 November 2011); doi: 10.1117/12.904787
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011D (30 November 2011); doi: 10.1117/12.904788
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011E (30 November 2011); doi: 10.1117/12.904792
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011F (30 November 2011); doi: 10.1117/12.904800
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011G (30 November 2011); doi: 10.1117/12.904813
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011H (30 November 2011); doi: 10.1117/12.904828
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011I (30 November 2011); doi: 10.1117/12.904833
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011J (30 November 2011); doi: 10.1117/12.904905
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011K (30 November 2011); doi: 10.1117/12.905015
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011L (30 November 2011); doi: 10.1117/12.905019
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011M (30 November 2011); doi: 10.1117/12.905311
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011N (1 December 2011); doi: 10.1117/12.905399
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011O (30 November 2011); doi: 10.1117/12.905826
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011Q (30 November 2011); doi: 10.1117/12.905926
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011R (30 November 2011); doi: 10.1117/12.906092
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011S (30 November 2011); doi: 10.1117/12.906229
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011T (30 November 2011); doi: 10.1117/12.906280
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011U (30 November 2011); doi: 10.1117/12.906369
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011V (30 November 2011); doi: 10.1117/12.906382
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011W (30 November 2011); doi: 10.1117/12.906384
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011X (30 November 2011); doi: 10.1117/12.906413
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011Y (30 November 2011); doi: 10.1117/12.906500
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82011Z (30 November 2011); doi: 10.1117/12.906515
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820120 (30 November 2011); doi: 10.1117/12.906579
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820122 (30 November 2011); doi: 10.1117/12.906614
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820123 (30 November 2011); doi: 10.1117/12.906662
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820124 (30 November 2011); doi: 10.1117/12.906942
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820125 (30 November 2011); doi: 10.1117/12.906955
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820126 (30 November 2011); doi: 10.1117/12.906981
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820127 (30 November 2011); doi: 10.1117/12.906995
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820128 (30 November 2011); doi: 10.1117/12.907009
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820129 (30 November 2011); doi: 10.1117/12.907018
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012A (1 December 2011); doi: 10.1117/12.907044
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012B (30 November 2011); doi: 10.1117/12.907062
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012D (30 November 2011); doi: 10.1117/12.907148
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012E (30 November 2011); doi: 10.1117/12.907163
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012F (30 November 2011); doi: 10.1117/12.907203
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012G (30 November 2011); doi: 10.1117/12.907218
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012H (30 November 2011); doi: 10.1117/12.907225
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012I (30 November 2011); doi: 10.1117/12.907258
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012J (30 November 2011); doi: 10.1117/12.907563
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012K (30 November 2011); doi: 10.1117/12.916692
Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82012L (30 November 2011); doi: 10.1117/12.916693
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