30 November 2011 Metrology on absolute fluorescence quantum efficiency for solid materials
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Proceedings Volume 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 82010Z (2011) https://doi.org/10.1117/12.903431
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China
Abstract
High-precision measurement for fluorescence quantum efficiency of solid materials has been a very cumbersome and complex process. In recent years, though many scholars have done a lot of studies, the relative and simplified measurement are mainly been emphasised on, and it is very difficult to obtain the accurate measurement uncertainty. Refering to NRC, on the basis of the little appropriate transformation on commercial instruments, this paper introduces the absolute quantum efficiency measurement for solid materials, based on double monochromator method. Currently, the measuring wavelength covers 250-800nm, the uncertainty of quantum efficiency is about 5%(k=2) .
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Guojin Feng, Guojin Feng, Yu Wang, Yu Wang, Ping Li, Ping Li, Tingting Guo, Tingting Guo, } "Metrology on absolute fluorescence quantum efficiency for solid materials", Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 82010Z (30 November 2011); doi: 10.1117/12.903431; https://doi.org/10.1117/12.903431
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