30 November 2011 Effect of slit widths on wavelength calibration of a Czerny-Turner double monochromator
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Proceedings Volume 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 820122 (2011) https://doi.org/10.1117/12.906614
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China
Abstract
Wavelength calibration is important for monochromator and spectrograph before accurate application. In the case of a Czerny-Turner double monochromator, work have been down to find out the relationship between slit widths and wavelength error. We do wavelength calibration in different widths of entrance and exit slits, then get wavelength error. The result shows that different widths of entrance slit and exit slit lead to different wavelength error, and wavelength error can be presented as a function of wavelength and slit widths through curve fitting. Thus, correction can be done by solving this function before accurate measurement.
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Huiquan Ouyang, Huiquan Ouyang, Caihong Dai, Caihong Dai, Bo Huang, Bo Huang, Zhifeng Wu, Zhifeng Wu, } "Effect of slit widths on wavelength calibration of a Czerny-Turner double monochromator", Proc. SPIE 8201, 2011 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 820122 (30 November 2011); doi: 10.1117/12.906614; https://doi.org/10.1117/12.906614
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