Accelerated aging test on LEDs life estimation

Yi Dong; Shu-sheng Zhang; Jiang-qi Du

doi:10.1117/12.906118

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28 November 2011 Accelerated aging test on LEDs life estimation

Yi Dong; Shu-sheng Zhang; Jiang-qi Du

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Proceedings Volume 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology; 820202 (2011) https://doi.org/10.1117/12.906118
Event: International Conference on Optical Instruments and Technology (OIT2011), 2011, Beijing, Beijing, China

Abstract

Light-emitting diodes(LEDs) have become very attractive in different application field such as Solid State Lighting, automotive and street lights, due to their long operative lifetime, lower energy consumption etc. This paper mainly introduces the accelerated aging test, we focus our attention on the study of a life model for LEDs by relating the time to failure with the supplying condition. The constant accelerated aging experiments were firstly performed on LED samples. Process the experiment data by exploiting the degradation of LED optical power formula and degradation coefficient. Finally, the average lifetime of the samples under normal conditions was calculated via using numerical analytical method. According to data, analysis the test result and the failure mechanism of LED, provide the technical basis to improve product design and quality assurance.

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Yi Dong, Shu-sheng Zhang, and Jiang-qi Du "Accelerated aging test on LEDs life estimation", Proc. SPIE 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology, 820202 (28 November 2011); https://doi.org/10.1117/12.906118

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