29 November 2011 Research on key technique of microscopy three-dimensional image reconstruction based on piezoelectric ceramics
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Abstract
Due to the limited depth of focus of microscope objective, a series of images taken from different sections and directions are needed to reconstruct 3D microscopy image. In this paper, we present a novel method which utilizes piezoelectric actuator, high magnification microscopy system without mirror and single CCD to observe micro-objects and reconstruct its three-dimensional image. Inverse piezoelectric effect of piezoelectric ceramics have some superior characteristics, such as high positioning resolution, high positioning accuracy, etc. And piezoelectric actuator possess the advantage of small-size, strong-power and easy- to-integrated as well. Based on these points, we designed a 360° rotation and tilt positioning platform. In this platform, Piezoelectric actuator is employed to ensure the positioning accuracy at axis-Z direction. At the same time, Motion of 360° rotation and tilt can be controlled precisely using stepping motor controlling technology. Furthermore, finite element methods (FEM) analyze software--ANSYS is used to analyze the rigidity, stress and structure optimization of the platform. This rotation and tilt mechanical positioning platform can help the single CCD to get clear, complete-view two dimensional images. This method paves the way for three-dimensional reconstruction of micro objects. Experiments demonstrate that this 360° rotation and tilt positioning stage is structure-simple and high-accurate. It can be widely used in micro-structure observing and three-dimensional image reconstruction among mechanics, materials and biology, etc.
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Jianhua Wang, Zexin Xiao, "Research on key technique of microscopy three-dimensional image reconstruction based on piezoelectric ceramics", Proc. SPIE 8202, 2011 International Conference on Optical Instruments and Technology: Solid State Lighting and Display Technologies, Holography, Speckle Pattern Interferometry, and Micro/Nano Manufacturing and Metrology, 820216 (29 November 2011); doi: 10.1117/12.907209; https://doi.org/10.1117/12.907209
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