29 October 2011 Homogeneity and internal defects detect of infrared Se-based chalcogenide glass
Author Affiliations +
Proceedings Volume 8205, 2011 International Conference on Photonics, 3D-Imaging, and Visualization; 82053I (2011) https://doi.org/10.1117/12.906139
Event: 2011 International Conference on Photonics, 3D-imaging, and Visualization, 2011, Guangzhou, China
Abstract
Ge-Sb-Se chalcogenide glasses is a kind of excellent infrared optical material, which has been enviromental friendly and widely used in infrared thermal imaging systems. However, due to the opaque feature of Se-based glasses in visible spectral region, it's difficult to measure their homogeneity and internal defect as the common oxide ones. In this study, a measurement was proposed to observe the homogeneity and internal defect of these glasses based on near-IR imaging technique and an effective measurement system was also constructed. The testing result indicated the method can gives the information of homogeneity and internal defect of infrared Se-based chalcogenide glass clearly and intuitionally.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zupana Li, Zupana Li, Ligang Wu, Ligang Wu, Changgui Lin, Changgui Lin, Bao'an Song, Bao'an Song, Xunsi Wang, Xunsi Wang, Xiang Shen, Xiang Shen, Shixunb Dai, Shixunb Dai, } "Homogeneity and internal defects detect of infrared Se-based chalcogenide glass", Proc. SPIE 8205, 2011 International Conference on Photonics, 3D-Imaging, and Visualization, 82053I (29 October 2011); doi: 10.1117/12.906139; https://doi.org/10.1117/12.906139
PROCEEDINGS
5 PAGES


SHARE
Back to Top