1 February 2012 Spectrally enhanced image resolution of tooth enamel surfaces
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Proceedings Volume 8208, Lasers in Dentistry XVIII; 82080F (2012); doi: 10.1117/12.914273
Event: SPIE BiOS, 2012, San Francisco, California, United States
Abstract
Short-wavelength 405 nm laser illumination of surface dental enamel using an ultrathin scanning fiber endoscope (SFE) produced enhanced detail of dental topography. The surfaces of human extracted teeth and artificial erosions were imaged with 405 nm, 444 nm, 532 nm, or 635 nm illumination lasers. The obtained images were then processed offline to compensate for any differences in the illumination beam diameters between the different lasers. Scattering and absorption coefficients for a Monte Carlo model of light propagation in dental enamel for 405 nm were scaled from published data at 532 nm and 633 nm. The value of the scattering coefficient used in the model was scaled from the coefficients at 532 nm and 633 nm by the inverse third power of wavelength. Simulations showed that the penetration depth of short-wavelength illumination is localized close to the enamel surface, while long-wavelength illumination travels much further and is backscattered from greater depths. Therefore, images obtained using short wavelength laser are not contaminated by the superposition of light reflected from enamel tissue at greater depths. Hence, the SFE with short-wavelength illumination may make it possible to visualize surface manifestations of phenomena such as demineralization, thus better aiding the clinician in the detection of early caries.
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Liang Zhang, Leonard Y. Nelson, Joel H. Berg, Eric J. Seibel, "Spectrally enhanced image resolution of tooth enamel surfaces", Proc. SPIE 8208, Lasers in Dentistry XVIII, 82080F (1 February 2012); doi: 10.1117/12.914273; https://doi.org/10.1117/12.914273
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KEYWORDS
Scattering

Teeth

Light scattering

Image resolution

Backscatter

Laser dentistry

Monte Carlo methods

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