3 February 2012 Restoration of high-resolution AFM images captured with broken probes
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Proceedings Volume 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX; 82271A (2012); doi: 10.1117/12.906752
Event: SPIE BiOS, 2012, San Francisco, California, United States
Abstract
A type of artefact is induced by damage of the scanning probe when the Atomic Force Microscope (AFM) captures a material surface structure with nanoscale resolution. This artefact has a dramatic form of distortion rather than the traditional blurring artefacts. Practically, it is not easy to prevent the damage of the scanning probe. However, by using natural image deblurring techniques in image processing domain, a comparatively reliable estimation of the real sample surface structure can be generated. This paper introduces a novel Hough Transform technique as well as a Bayesian deblurring algorithm to remove this type of artefact. The deblurring result is successful at removing blur artefacts in the AFM artefact images. And the details of the fibril surface topography are well preserved.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Y. F. Wang, D. Corrigan, C. Forman, S. Jarvis, A. Kokaram, "Restoration of high-resolution AFM images captured with broken probes", Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 82271A (3 February 2012); doi: 10.1117/12.906752; https://doi.org/10.1117/12.906752
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KEYWORDS
Atomic force microscopy

Distortion

Hough transforms

Deconvolution

Image analysis

Image processing

Convolution

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