11 February 2012 Self-referenced quantitative phase microscopy
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Proceedings Volume 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX; 82271S (2012); doi: 10.1117/12.909701
Event: SPIE BiOS, 2012, San Francisco, California, United States
Abstract
Self-referenced quantitative phase microscopy (SrQPM) is reported, wherein quantitative phase imaging is achieved through the interference of the sample wave with a reflected version of itself. The off-axis interference between the two beams generates a spatially modulated hologram that is analyzed to quantify the sample's amplitude and phase profile. SrQPM requires approximately one-half of the object field of view to be empty and optically flat, which serves as a reference for the other half of the field of view containing the sample.
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Timothy R. Hillman, Niyom Lue, Yongjin Sung, Ramachandra R. Dasari, Peter T. C. So, Zahid Yaqoob, "Self-referenced quantitative phase microscopy", Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 82271S (11 February 2012); doi: 10.1117/12.909701; https://doi.org/10.1117/12.909701
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KEYWORDS
Microscopy

Holograms

Phase imaging

Diffraction

Microscopes

Digital holography

Mirrors

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