Paper
10 February 2012 Self-referenced quantitative phase microscopy
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Abstract
Self-referenced quantitative phase microscopy (SrQPM) is reported, wherein quantitative phase imaging is achieved through the interference of the sample wave with a reflected version of itself. The off-axis interference between the two beams generates a spatially modulated hologram that is analyzed to quantify the sample's amplitude and phase profile. SrQPM requires approximately one-half of the object field of view to be empty and optically flat, which serves as a reference for the other half of the field of view containing the sample.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Timothy R. Hillman, Niyom Lue, Yongjin Sung, Ramachandra R. Dasari, Peter T. C. So, and Zahid Yaqoob "Self-referenced quantitative phase microscopy", Proc. SPIE 8227, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XIX, 82271S (10 February 2012); https://doi.org/10.1117/12.909701
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Cited by 1 scholarly publication.
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KEYWORDS
Microscopy

Holograms

Phase imaging

Diffraction

Microscopes

Digital holography

Mirrors

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