Translator Disclaimer
8 February 2012 Emission properties of diode laser bars during pulsed high-power operation
Author Affiliations +
High power diode laser bars are subjected to single pulse step tests carried out up to and beyond their ultimate limits of operation. Laser nearfields and thermal behavior are monitored for pulse widths in the 10 μs-2 ms-range with streak- and thermo-cameras, respectively. The final phase of the tests allows the in situ observation of the catastrophic optical damage (COD) effect. We find perfect agreement between the location of COD signatures observed by transient emission and thermo-camera measurements on the one side, and optical inspection of the degraded bars on the other side. COD thresholds are determined and the observed dependence on the pulse length is qualitatively explained. This approach allows for testing hardness and homogeneity of facet coatings on a bar level with or without consideration of accidental early single-emitter failure effects and thermal crosstalk between the emitters. It helps embanking sudden degradation and provides insight into the mechanisms governing the device emission behavior at ultimate output powers.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Marcin Olecki, Jens W. Tomm, Martin Hempel, Petra Hennig, and Thomas Elsaesser "Emission properties of diode laser bars during pulsed high-power operation", Proc. SPIE 8241, High-Power Diode Laser Technology and Applications X, 824107 (8 February 2012);


Highly reliable high power AlGaAs GaAs 808 nm diode laser...
Proceedings of SPIE (February 19 2007)
High power high efficiency 910 to 980 nm broad...
Proceedings of SPIE (June 01 2004)
Aging tests of high power diode lasers as a basis...
Proceedings of SPIE (November 20 1996)
Reliability of fuzes based on diode laser assemblies
Proceedings of SPIE (September 03 2010)

Back to Top