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28 February 2012 Dispersion analysis of subwavelength square apertures at optical frequencies
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Abstract
We present an analytical study of resonance properties of square subwavelength apertures at optical and near-IR frequencies. This approach allows accurate prediction of resonance responses, captures both propagating and evanescent modes, and can easily be implemented in other analytical techniques. In this approach we avoid analyzing the detailed behavior of the fields inside the metal walls, but still obtain the effects of the buildup of charges within those walls. We calculate the dispersion relation and find the cutoff frequency's dependence on cavity dimensions for a square aperture embedded in a silver film, and support our findings with finite-element simulations.
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Eli Lansey, Jonah N. Gollub, and David T. Crouse "Dispersion analysis of subwavelength square apertures at optical frequencies", Proc. SPIE 8255, Physics and Simulation of Optoelectronic Devices XX, 82550R (28 February 2012); https://doi.org/10.1117/12.908756
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