Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer

Chih-Jen Yu; Yao-Teng Tseng; Kuei-Chu Hsu; Chien Chou

doi:10.1117/12.907016

28 February 2012 Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer

Chih-Jen Yu, Yao-Teng Tseng, Kuei-Chu Hsu, Chien Chou

Author Affiliations +

Proceedings Volume 8255, Physics and Simulation of Optoelectronic Devices XX; 82551T (2012) https://doi.org/10.1117/12.907016
Event: SPIE OPTO, 2012, San Francisco, California, United States

Abstract

Based on the equivalence theorem of a unitary optical system. We proposed an analytical approach to characterize the cell parameters of a twisted nematic liquid crystal device (TNLCD) with full field resolution. The spatial distribution of three characteristic parameters of a TNLCD were measured by using a polarizer-sample-analyzer imaging ellipsometer, thus the untwisted phase retardation, cell thickness and twisted angle of a TNLCD can be directly calculated through the explicit expressions as a function of its characteristic parameters. The measured results are very close to the design values provided by TNLCD manufacture. This method shows that both the system setup and parameters calculating process are quite simple. It would be more helpful to characterize a TNLCD in the manufacturing process.

Citation Download Citation

Chih-Jen Yu, Yao-Teng Tseng, Kuei-Chu Hsu, and Chien Chou "Two-dimensional cell parameters measurement of a twisted nematic liquid crystal device by using imaging ellipsometer", Proc. SPIE 8255, Physics and Simulation of Optoelectronic Devices XX, 82551T (28 February 2012); https://doi.org/10.1117/12.907016

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