Paper
20 January 2012 III-V-N alloys grown by MOVPE in H2 and N2 mixed carrier gases
S. Kuboya, Q. T. Thieu, S. Sanorpim, R. Katayama, K. Onabe
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Abstract
The MOVPE growth properties of GaAsN and InAsN in H2 and N2 mixed carrier gases are studied. The N contents of the GaAsN and InAsN films increase with increasing the N2/(H2+N2) ratio in the H2 and N2 mixed carrier gas. The growth rate reduction of GaAsN films in higher N2/(H2+N2) ratio is explained by the smaller diffusion coefficients of precursors. The pyrolysis of 1,1-dimethylhydrazine (DMHy) is investigated by a quadrupole mass spectrometer (QMS) that is combined with the MOVPE growth reactor. At lower temperatures, the pyrolysis of DMHy in H2 carrier gas is higher than that in N2 carrier gas. The results indicate that the higher N contents at the higher N2/(H2+N2) ratios in the mixed carrier gases are attributed to the suppression of the decomposition of III-V-N films as NHx. The higher reactor pressure also exhibits higher N contents in each carrier gas. It is interpreted as the effect of the faster growth rates and the higher DMHy pyrolysis.
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S. Kuboya, Q. T. Thieu, S. Sanorpim, R. Katayama, and K. Onabe "III-V-N alloys grown by MOVPE in H2 and N2 mixed carrier gases", Proc. SPIE 8268, Quantum Sensing and Nanophotonic Devices IX, 82680I (20 January 2012); https://doi.org/10.1117/12.907981
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KEYWORDS
Gases

Diffusion

Spectroscopy

Gallium arsenide

Semiconductors

Aluminum

Indium arsenide

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