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8 February 2012 High sensitivity spectroscopic and thermal characterization of cooling efficiency for optical refrigeration materials
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Proceedings Volume 8275, Laser Refrigeration of Solids V; 827504 (2012) https://doi.org/10.1117/12.910202
Event: SPIE OPTO, 2012, San Francisco, California, United States
Abstract
Since recent demonstration of cryogenic optical refrigeration, a need for reliable characterization tools of cooling performance of different materials is in high demand. We present our experimental apparatus that allows for temperature and wavelength dependent characterization of the materials' cooling efficiency and is based on highly sensitive spectral differencing technique or two-band differential spectral metrology (2B-DSM). First characterization of a 5% w.t. ytterbium-doped YLF crystal showed quantitative agreement with the current laser cooling model, as well as measured a minimum achievable temperature (MAT) at 110 K. Other materials and ion concentrations are also investigated and reported here.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Seth D. Melgaard, Denis V. Seletskiy, Alberto Di Lieto, Mauro Tonelli, and Mansoor Sheik-Bahae "High sensitivity spectroscopic and thermal characterization of cooling efficiency for optical refrigeration materials", Proc. SPIE 8275, Laser Refrigeration of Solids V, 827504 (8 February 2012); https://doi.org/10.1117/12.910202
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