8 February 2012 Polarization-resolved optical metrology for noncontact thermometry
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Proceedings Volume 8275, Laser Refrigeration of Solids V; 82750J (2012) https://doi.org/10.1117/12.910342
Event: SPIE OPTO, 2012, San Francisco, California, United States
Abstract
Noncontact temperature measurements with large (thermal) dynamic range are desirable in many applications. Aside from interferometric techniques, fluorescence intensity and spectral shape have been exploited in the past for sensitive thermometry in luminescent materials. Here, we present a novel method that utilizes the polarization-sensitive reflection and/or transmission of light from (through) an optical material without relying on any fluorescence. A balanced photodetector will measure the difference signal corresponding to two orthogonal polarization states with high singal-tonoise ratio. Temperature resolution of 5 mK have been demonstrated.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
M. Ghasemkhani, M. Ghasemkhani, D. V. Seletskiy, D. V. Seletskiy, M. Sheik-Bahae, M. Sheik-Bahae, } "Polarization-resolved optical metrology for noncontact thermometry", Proc. SPIE 8275, Laser Refrigeration of Solids V, 82750J (8 February 2012); doi: 10.1117/12.910342; https://doi.org/10.1117/12.910342
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