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14 October 2011 Micro-displacement sensor using a Mach-Zehnder interferometer with long-period gratings
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Proceedings Volume 8287, Eighth Symposium Optics in Industry; 82870Z (2011) https://doi.org/10.1117/12.913337
Event: Eighth Symposium Optics in Industry, 2011, Toluca de Lerdo, Mexico
Abstract
We present the fabrication and characterization of a micro-displacement sensor using Mach-Zehnder interferometer in conventional optical fiber SMF28-e. The Mach-Zehnder interferometer uses a configuration of two long-period gratings (LPG) in series mechanically induced. The Mach-Zehnder interferometers were made to operate in the region of 1300 nm. As a result the interferometers were obtained with transmission bands with a bandwidth of 2 nm, extinction ratio of 12 dB and insertion loss of 2 to 3 dB. The characterization of the interferometer was found to be measured displacements up to 500 μm with a resolution of 7 microns, which envisions potential applications of micro-displacement sensor in the measurement of micro-deformations.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
K. M. Salas-Alcántara, I. Torres-Gómez, D. Monzón-Hernández, A. Martínez-Ríos, and Luis Armando García-de-la-Rosa "Micro-displacement sensor using a Mach-Zehnder interferometer with long-period gratings", Proc. SPIE 8287, Eighth Symposium Optics in Industry, 82870Z (14 October 2011); https://doi.org/10.1117/12.913337
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