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30 January 2012 Single frame coaxial 3D measurement using depth from defocus of projection system
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We propose 3D profilometry based on depth from defocus of the projection system with the same axis of imaging system. In this system, the stripe pattern generated by DLP Light commander is projected on the object, and it moves on object's surface generating temporal variation of the light intensity. The projected stripe pattern is defocused depending on its distance from the focal plane. By moving the stripe pattern, defocused spatial frequency component is captured by temporal frequency analysis. We use correlation image sensor (CIS) to capture the temporal frequency component in a single frame. CIS outputs the Fourier coefficients of incident light in each pixel for every frames, and therefore it enables single frame 3D measurement. Evaluation experiments show that projection defocus depends on the distance from the focal plane, and it can be used for 3D measurement.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Toru Kurihara and Shigeru Ando "Single frame coaxial 3D measurement using depth from defocus of projection system", Proc. SPIE 8290, Three-Dimensional Image Processing (3DIP) and Applications II, 82900V (30 January 2012);


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