Selecting the proper window for SSIM

Steven B. McFadden; Paul A. S. Ward

doi:10.1117/12.909544

24 January 2012 Selecting the proper window for SSIM

Steven B. McFadden, Paul A. S. Ward

Proceedings Volume 8293, Image Quality and System Performance IX; 82930B (2012) https://doi.org/10.1117/12.909544
Event: IS&T/SPIE Electronic Imaging, 2012, Burlingame, California, United States

Abstract

The structural similarity index (SSIM) is a well-known metric in the field of image quality assessment (IQA). It is a full-reference metric that uses a sliding window to determine local quality/distortion measures between two images (based on a combination of luminance, contrast, and structural measurements from each image's window), and combines the results to obtain a single value indicating the quality of the distorted image relative to its perfect reference image. The metric uses a window of arbitrary size and shape to compute the localized measurements, but no work has been done to determine the effects of different window selections. This paper provides insight into these effects by testing various window modifications against six publicly-available image quality databases. Optimal window results are presented as well as a visual mapping of window parameters vs. performance.

Citation Download Citation

Steven B. McFadden and Paul A. S. Ward "Selecting the proper window for SSIM", Proc. SPIE 8293, Image Quality and System Performance IX, 82930B (24 January 2012); https://doi.org/10.1117/12.909544

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