Highly scalable methods for exploiting a label with unknown location in order to orient a set of single-particle cryo electron microscopy images

Cory J. Prust; Qiu Wang; Peter C. Doerschuk; John E. Johnson

doi:10.1117/12.917838

10 February 2012 Highly scalable methods for exploiting a label with unknown location in order to orient a set of single-particle cryo electron microscopy images

Cory J. Prust, Qiu Wang, Peter C. Doerschuk, John E. Johnson

Author Affiliations +

Proceedings Volume 8296, Computational Imaging X; 82960B (2012) https://doi.org/10.1117/12.917838
Event: IS&T/SPIE Electronic Imaging, 2012, Burlingame, California, United States

Abstract

A highly scalable method for determining the projection orientation of each image in a set of cryo electron microscopy images of a labeled particle is proposed. The method relies on the presence of a label that is a sufficiently strong scatterer such that its 2-D location in each image can be restricted to at most a small number of sites by processing applied to each image individually. It is not necessary to know the 3-D location of the label on the particle. After first determining the possible locations of the label in the 2-D images in parallel, the information from all images is fused to determine the 3-D location of the label on the particle and then the 3-D location is used to determine the projection orientation for each image by processing each image individually. With projection orientations, many algorithms exist for computing the 3-D reconstruction. The performance of the algorithm is studied as a function of the label SNR.

Citation Download Citation

Cory J. Prust, Qiu Wang, Peter C. Doerschuk, and John E. Johnson "Highly scalable methods for exploiting a label with unknown location in order to orient a set of single-particle cryo electron microscopy images", Proc. SPIE 8296, Computational Imaging X, 82960B (10 February 2012); https://doi.org/10.1117/12.917838

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