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10 February 2012 Highly scalable methods for exploiting a label with unknown location in order to orient a set of single-particle cryo electron microscopy images
Cory J. Prust, Qiu Wang, Peter C. Doerschuk, John E. Johnson
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Proceedings Volume 8296, Computational Imaging X; 82960B (2012) https://doi.org/10.1117/12.917838
Event: IS&T/SPIE Electronic Imaging, 2012, Burlingame, California, United States
Abstract
A highly scalable method for determining the projection orientation of each image in a set of cryo electron microscopy images of a labeled particle is proposed. The method relies on the presence of a label that is a sufficiently strong scatterer such that its 2-D location in each image can be restricted to at most a small number of sites by processing applied to each image individually. It is not necessary to know the 3-D location of the label on the particle. After first determining the possible locations of the label in the 2-D images in parallel, the information from all images is fused to determine the 3-D location of the label on the particle and then the 3-D location is used to determine the projection orientation for each image by processing each image individually. With projection orientations, many algorithms exist for computing the 3-D reconstruction. The performance of the algorithm is studied as a function of the label SNR.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Cory J. Prust, Qiu Wang, Peter C. Doerschuk, and John E. Johnson "Highly scalable methods for exploiting a label with unknown location in order to orient a set of single-particle cryo electron microscopy images", Proc. SPIE 8296, Computational Imaging X, 82960B (10 February 2012); https://doi.org/10.1117/12.917838
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KEYWORDS
Particles

Expectation maximization algorithms

3D image processing

Signal to noise ratio

Electron microscopy

Image processing

Reconstruction algorithms

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