Sensor yield is directly related to the probability of defective pixel occurrence and the screening criteria.
Assuming a spatially independent distribution of single pixel defects, effective on-the-fly correction of singlepixel
defects in a color plane, and effective correction of two-pixel defects in a color plane (couplets) through
a defect map, sensor yield can be computed based on the occurrence of three adjacent defective pixels in a
color plane (triplets). Closed-form equations are derived for calculating the probability of occurrence of
couplets and triplets as a function of the probability of a single pixel being defective. If a maximum of one
triplet is allowed in a 5-megapixel sensor, to obtain a 98% yield, the probability of a pixel being defective (p)
must not exceed 1.3E-3 (6500 defective pixels). For an 8-megapixel sensor, the corresponding requirement
would be p < 1.1E-3 (8900 defective pixels). Numerical simulation experiments have confirmed the accuracy
of the derived equations.