Sensor defect probability estimation and yield

Honghong Peng; Brian Keelan

doi:10.1117/12.912142

Abstract

Sensor yield is directly related to the probability of defective pixel occurrence and the screening criteria. Assuming a spatially independent distribution of single pixel defects, effective on-the-fly correction of singlepixel defects in a color plane, and effective correction of two-pixel defects in a color plane (couplets) through a defect map, sensor yield can be computed based on the occurrence of three adjacent defective pixels in a color plane (triplets). Closed-form equations are derived for calculating the probability of occurrence of couplets and triplets as a function of the probability of a single pixel being defective. If a maximum of one triplet is allowed in a 5-megapixel sensor, to obtain a 98% yield, the probability of a pixel being defective (p) must not exceed 1.3E-3 (6500 defective pixels). For an 8-megapixel sensor, the corresponding requirement would be p < 1.1E-3 (8900 defective pixels). Numerical simulation experiments have confirmed the accuracy of the derived equations.

Citation Download Citation

Honghong Peng, Honghong Peng, Brian Keelan, Brian Keelan, } "Sensor defect probability estimation and yield", Proc. SPIE 8299, Digital Photography VIII, 829903 (24 January 2012); doi: 10.1117/12.912142; https://doi.org/10.1117/12.912142

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