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2 February 2012 Vision-based in-line fabric defect detection using yarn-specific shape features
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Proceedings Volume 8300, Image Processing: Machine Vision Applications V; 83000G (2012)
Event: IS&T/SPIE Electronic Imaging, 2012, Burlingame, California, United States
We develop a methodology for automatic in-line flaw detection in industrial woven fabrics. Where state of the art detection algorithms apply texture analysis methods to operate on low-resolved (~200 ppi) image data, we describe here a process flow to segment single yarns in high-resolved (~1000 ppi) textile images. Four yarn shape features are extracted, allowing a precise detection and measurement of defects. The degree of precision reached allows a classification of detected defects according to their nature, providing an innovation in the field of automatic fabric flaw detection. The design has been carried out to meet real time requirements and face adverse conditions caused by loom vibrations and dirt. The entire process flow is discussed followed by an evaluation using a database with real-life industrial fabric images. This work pertains to the construction of an on-loom defect detection system to be used in manufacturing practice.
© (2012) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Dorian Schneider and Til Aach "Vision-based in-line fabric defect detection using yarn-specific shape features", Proc. SPIE 8300, Image Processing: Machine Vision Applications V, 83000G (2 February 2012);

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