28 November 2011 Control of mode Q factor and direction-emission by metal confinement for defected circular microresonators
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Proceedings Volume 8308, Optoelectronic Materials and Devices VI; 83080N (2011) https://doi.org/10.1117/12.903601
Event: SPIE/OSA/IEEE Asia Communications and Photonics, 2011, Shanghai, China
Abstract
Wavelength-scale defected circular microresonators with laterally confined metal layer are designed for directional emission from high Q confined modes by boundary element method (BEM), which is firstly applied to the multilayer structures. The influence of metal layer thickness on the mode filed patterns and Q factors are simulated. The results indicate that the thickness of the metal layer has a great effect on far-field emission patterns and the mode Q factors.
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Qi-Feng Yao, Jian-Dong Lin, Yue-De Yang, Yong-Zhen Huang, "Control of mode Q factor and direction-emission by metal confinement for defected circular microresonators", Proc. SPIE 8308, Optoelectronic Materials and Devices VI, 83080N (28 November 2011); doi: 10.1117/12.903601; https://doi.org/10.1117/12.903601
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