An apparatus for time-resolved X-ray absorption measurements is discussed. The apparatus consists of a 15 ns, 20 J Nd:YAG/glass laser system, a polychromator for soft X-rays and a multichannel detector system. X-ray emission spectra of a laser produced plasma (LPP) for 15 different target materials are shown. Time resolved X-ray absorption measurements (90-190 eV) on clouds of Si particles, produced by laser irradiation of bulk Si, are presented. From these measurements the following results were obtained: Clusters are formed at an irradiance as low as 3.0 J/cm2; at an irradiance of 14 J/cm2 ionized species up to Si 4+ are formed; at an irradiance of J/cm2 at 15 ns pulse duration, a Si layer thickness of 80 Å is removed.
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