Paper
4 February 1988 Use Of A Laser Produced Plasma In Time-Resolved Transmission And Reflection Spectroscopy
H. van Brug, M.J. van der Wiel
Author Affiliations +
Abstract
An apparatus for time-resolved X-ray absorption measurements is discussed. The apparatus consists of a 15 ns, 20 J Nd:YAG/glass laser system, a polychromator for soft X-rays and a multichannel detector system. X-ray emission spectra of a laser produced plasma (LPP) for 15 different target materials are shown. Time resolved X-ray absorption measurements (90-190 eV) on clouds of Si particles, produced by laser irradiation of bulk Si, are presented. From these measurements the following results were obtained: Clusters are formed at an irradiance as low as 3.0 J/cm2; at an irradiance of 14 J/cm2 ionized species up to Si 4+ are formed; at an irradiance of J/cm2 at 15 ns pulse duration, a Si layer thickness of 80 Å is removed.
© (1988) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
H. van Brug and M.J. van der Wiel "Use Of A Laser Produced Plasma In Time-Resolved Transmission And Reflection Spectroscopy", Proc. SPIE 0831, X-Rays from Laser Plasmas, (4 February 1988); https://doi.org/10.1117/12.965032
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Silicon

Absorption

Plasma

X-rays

Particles

Laser beam diagnostics

Clouds

Back to Top