PROCEEDINGS VOLUME 8321
SEVENTH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION | 7-11 AUGUST 2011
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
SEVENTH INTERNATIONAL SYMPOSIUM ON PRECISION ENGINEERING MEASUREMENTS AND INSTRUMENTATION
7-11 August 2011
Yunnan, China
Front Matter: Volume 8321
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832101 (13 December 2011); doi: 10.1117/12.920295
Seventh International Symposium on Precision Engineering Measurements and Instrumentation
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832102 (16 November 2011); doi: 10.1117/12.903589
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832103 (16 November 2011); doi: 10.1117/12.903596
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832104 (16 November 2011); doi: 10.1117/12.903641
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832105 (16 November 2011); doi: 10.1117/12.903653
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832106 (16 November 2011); doi: 10.1117/12.903654
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832108 (16 November 2011); doi: 10.1117/12.903659
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832109 (16 November 2011); doi: 10.1117/12.903663
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210A (16 November 2011); doi: 10.1117/12.903666
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210B (16 November 2011); doi: 10.1117/12.903667
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210C (16 November 2011); doi: 10.1117/12.903704
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210D (16 November 2011); doi: 10.1117/12.903708
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210E (16 November 2011); doi: 10.1117/12.903710
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210F (16 November 2011); doi: 10.1117/12.903714
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210G (16 November 2011); doi: 10.1117/12.903717
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210H (16 November 2011); doi: 10.1117/12.903718
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210I (16 November 2011); doi: 10.1117/12.903720
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210J (16 November 2011); doi: 10.1117/12.916655
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210K (16 November 2011); doi: 10.1117/12.903767
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210L (16 November 2011); doi: 10.1117/12.903771
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210M (16 November 2011); doi: 10.1117/12.903772
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210N (16 November 2011); doi: 10.1117/12.903773
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210O (16 November 2011); doi: 10.1117/12.903778
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210P (16 November 2011); doi: 10.1117/12.903781
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210Q (16 November 2011); doi: 10.1117/12.903846
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210R (16 November 2011); doi: 10.1117/12.903851
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210S (16 November 2011); doi: 10.1117/12.903853
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210T (16 November 2011); doi: 10.1117/12.903860
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210U (16 November 2011); doi: 10.1117/12.903890
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210V (16 November 2011); doi: 10.1117/12.903903
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210W (16 November 2011); doi: 10.1117/12.903907
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210X (16 November 2011); doi: 10.1117/12.903908
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210Y (16 November 2011); doi: 10.1117/12.903923
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210Z (16 November 2011); doi: 10.1117/12.903935
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832110 (16 November 2011); doi: 10.1117/12.903939
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832111 (16 November 2011); doi: 10.1117/12.903961
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832112 (16 November 2011); doi: 10.1117/12.903972
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832113 (16 November 2011); doi: 10.1117/12.903978
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832114 (16 November 2011); doi: 10.1117/12.903980
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832115 (16 November 2011); doi: 10.1117/12.903984
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832116 (16 November 2011); doi: 10.1117/12.903987
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832117 (16 November 2011); doi: 10.1117/12.904003
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832118 (16 November 2011); doi: 10.1117/12.904021
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832119 (16 November 2011); doi: 10.1117/12.904072
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211A (16 November 2011); doi: 10.1117/12.904076
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211B (16 November 2011); doi: 10.1117/12.904077
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211C (16 November 2011); doi: 10.1117/12.904106
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211D (16 November 2011); doi: 10.1117/12.904109
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211E (16 November 2011); doi: 10.1117/12.904162
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211F (16 November 2011); doi: 10.1117/12.904266
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211G (16 November 2011); doi: 10.1117/12.904303
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211H (16 November 2011); doi: 10.1117/12.904370
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211I (16 November 2011); doi: 10.1117/12.904619
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211J (16 November 2011); doi: 10.1117/12.904635
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211K (16 November 2011); doi: 10.1117/12.904645
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211L (16 November 2011); doi: 10.1117/12.904654
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211M (16 November 2011); doi: 10.1117/12.904664
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211N (16 November 2011); doi: 10.1117/12.904709
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211O (16 November 2011); doi: 10.1117/12.904713
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211P (16 November 2011); doi: 10.1117/12.904757
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211Q (16 November 2011); doi: 10.1117/12.904766
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211R (16 November 2011); doi: 10.1117/12.904784
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211S (16 November 2011); doi: 10.1117/12.904810
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211T (16 November 2011); doi: 10.1117/12.904816
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211U (16 November 2011); doi: 10.1117/12.904817
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211V (16 November 2011); doi: 10.1117/12.904832
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211W (16 November 2011); doi: 10.1117/12.904838
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211X (16 November 2011); doi: 10.1117/12.904848
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211Y (16 November 2011); doi: 10.1117/12.904851
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83211Z (16 November 2011); doi: 10.1117/12.904875
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832120 (16 November 2011); doi: 10.1117/12.904881
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832121 (16 November 2011); doi: 10.1117/12.904884
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832122 (16 November 2011); doi: 10.1117/12.904890
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832123 (16 November 2011); doi: 10.1117/12.904929
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832124 (16 November 2011); doi: 10.1117/12.904932
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832125 (16 November 2011); doi: 10.1117/12.904935
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832126 (16 November 2011); doi: 10.1117/12.904937
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832127 (16 November 2011); doi: 10.1117/12.904943
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832128 (16 November 2011); doi: 10.1117/12.904945
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832129 (16 November 2011); doi: 10.1117/12.904956
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212A (16 November 2011); doi: 10.1117/12.904959
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212B (16 November 2011); doi: 10.1117/12.904997
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212C (16 November 2011); doi: 10.1117/12.904998
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212D (16 November 2011); doi: 10.1117/12.904999
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212E (16 November 2011); doi: 10.1117/12.905003
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212F (16 November 2011); doi: 10.1117/12.905016
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212G (16 November 2011); doi: 10.1117/12.905055
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212H (16 November 2011); doi: 10.1117/12.905061
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212I (16 November 2011); doi: 10.1117/12.905070
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212J (16 November 2011); doi: 10.1117/12.905072
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212K (16 November 2011); doi: 10.1117/12.905077
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212L (16 November 2011); doi: 10.1117/12.905078
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212M (16 November 2011); doi: 10.1117/12.905089
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212N (16 November 2011); doi: 10.1117/12.905119
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212O (16 November 2011); doi: 10.1117/12.905128
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212P (16 November 2011); doi: 10.1117/12.905129
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212Q (16 November 2011); doi: 10.1117/12.905133
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212R (16 November 2011); doi: 10.1117/12.905134
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212S (16 November 2011); doi: 10.1117/12.905135
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212T (16 November 2011); doi: 10.1117/12.905167
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212U (16 November 2011); doi: 10.1117/12.905172
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212V (16 November 2011); doi: 10.1117/12.905193
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212W (16 November 2011); doi: 10.1117/12.905196
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212X (16 November 2011); doi: 10.1117/12.905202
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212Y (16 November 2011); doi: 10.1117/12.905203
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83212Z (16 November 2011); doi: 10.1117/12.905204
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832130 (16 November 2011); doi: 10.1117/12.905205
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832131 (16 November 2011); doi: 10.1117/12.905209
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832132 (16 November 2011); doi: 10.1117/12.905211
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832133 (16 November 2011); doi: 10.1117/12.905216
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832134 (16 November 2011); doi: 10.1117/12.905219
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832135 (16 November 2011); doi: 10.1117/12.905227
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832136 (16 November 2011); doi: 10.1117/12.905244
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832137 (16 November 2011); doi: 10.1117/12.905245
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832138 (16 November 2011); doi: 10.1117/12.905255
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832139 (16 November 2011); doi: 10.1117/12.905261
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213A (16 November 2011); doi: 10.1117/12.905263
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213B (16 November 2011); doi: 10.1117/12.905267
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213C (16 November 2011); doi: 10.1117/12.905283
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213D (16 November 2011); doi: 10.1117/12.905290
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213E (16 November 2011); doi: 10.1117/12.905291
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213F (16 November 2011); doi: 10.1117/12.905306
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213G (16 November 2011); doi: 10.1117/12.905322
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213H (16 November 2011); doi: 10.1117/12.905323
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213I (16 November 2011); doi: 10.1117/12.905324
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213J (16 November 2011); doi: 10.1117/12.905331
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213K (16 November 2011); doi: 10.1117/12.905334
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213L (16 November 2011); doi: 10.1117/12.905338
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213M (16 November 2011); doi: 10.1117/12.905347
Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83213N (16 November 2011); doi: 10.1117/12.905349