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15 November 2011 Micro-vision-based displacement measurement with high accuracy
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Proceedings Volume 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation; 83210I (2011) https://doi.org/10.1117/12.903720
Event: Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 2011, Yunnan, China
Abstract
The micro-motion stages are widely used in micro/nano manufacturing technology. In this paper, an integrated approach for measuring micro-displacement of micro-motion stage that incorporates motion estimation algorithm into the computer microvision is proposed. At first, the basic principle of the computer microvision measurement is analyzed. Then, a robust multiscale motion estimation algorithm for micro-motion measurement is proposed. Finally, the microdisplacement of the micro-motion stage based on the piezoelectric ceramic actuators and the compliant mechanisms is measured using the integrated approach. The maximal bias of the proposed approach reached 13 nm. Experimental results show that the new integrated method can measure micro-displacement with nanometer accuracy.
© (2011) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Qinghua Lu, Xianmin Zhang, and Yanbin Fan "Micro-vision-based displacement measurement with high accuracy", Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 83210I (15 November 2011); https://doi.org/10.1117/12.903720
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