15 November 2011 Imaging spectrograph for fast LED optical properties measurement
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Proceedings Volume 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation; 832126 (2011) https://doi.org/10.1117/12.904937
Event: Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 2011, Yunnan, China
Abstract
Due to the booming in LED applications, fast and accurate inspection tools to monitor LED quality is necessary. In this paper, we propose two new methods to measure LED optical properties by using imaging spectrograph. Imaging-type spectrograph with high spatial and spectral resolutions is designed for LED wafer measurement. Fiber-type spectrograph with multi-head structure is designed for LED backlight and LED light-bar measurement. Optical properties of LED include chromaticity and luminous intensity, which are measured by following CIE recommendations. The performance of imaging spectrograph is evaluated to meet industrial requirements for LED measurement.
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Kai-Ping Chuang, Kai-Ping Chuang, Fu-Cheng Yang, Fu-Cheng Yang, Yu-Shan Chang, Yu-Shan Chang, Mao-Sheng Huang, Mao-Sheng Huang, } "Imaging spectrograph for fast LED optical properties measurement", Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832126 (15 November 2011); doi: 10.1117/12.904937; https://doi.org/10.1117/12.904937
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