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15 November 2011 Evaluation method for one-dimensional assembly yield based on Taguchi orthogonal experiment
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Proceedings Volume 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation; 832136 (2011) https://doi.org/10.1117/12.905244
Event: Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 2011, Yunnan, China
Abstract
Evaluation method for one-dimensional assembly yield is presented based on Taguchi orthogonal experiment. Firstly, according to Taguchi parameter design criteria, component loop sizes are taken for factors of Taguchi orthogonal experiment, each factor is divided into three levels. After approriate orthogonal experiment table is selected, orthogonal experiment is operated. Then the mean and standard deviation of close loop size are solved, which are used to obtain assembly yield. The influence on assembly yield of each factor is analyzed by using extreme value method and the results are validated by using Monte Carlo simulation. Finally, a gear components assembly is provided to illustrate the effectiveness of the presented method .It has a guiding significance for machanical assembly design.
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Zejun Wen, Zhengqiang Zhu, Zhijin Zhou, and Shuyi Yang "Evaluation method for one-dimensional assembly yield based on Taguchi orthogonal experiment", Proc. SPIE 8321, Seventh International Symposium on Precision Engineering Measurements and Instrumentation, 832136 (15 November 2011); doi: 10.1117/12.905244; https://doi.org/10.1117/12.905244
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