Enhancing of structures in coherence probe microscopy imaging

Bettina Heise; Stefan E. Schausberger; Christian Maurer; Monika Ritsch-Marte; Stefan Bernet; David Stifter

doi:10.1117/12.918160

15 November 2011 Enhancing of structures in coherence probe microscopy imaging

Bettina Heise, Stefan E. Schausberger, Christian Maurer, Monika Ritsch-Marte, Stefan Bernet, David Stifter

Proceedings Volume 8335, 2012 International Workshop on Image Processing and Optical Engineering; 83350G (2011) https://doi.org/10.1117/12.918160
Event: 2012 International Workshop on Image Processing and Optical Engineering, 2012, Harbin, China

Abstract

The principle of Fourier plane filtering in coherence probe microscopy (CPM) is demonstrated. It is shown that an edge contrast enhancement can be obtained in an isotropic and anisotropic way for different technical materials containing interfaces or internal micro-structures. Additionally image processing completes the CPM imaging and analysis.

Citation Download Citation

Bettina Heise, Stefan E. Schausberger, Christian Maurer, Monika Ritsch-Marte, Stefan Bernet, and David Stifter "Enhancing of structures in coherence probe microscopy imaging", Proc. SPIE 8335, 2012 International Workshop on Image Processing and Optical Engineering, 83350G (15 November 2011); https://doi.org/10.1117/12.918160

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