22 November 2011 Use of electron diffraction for determination of strain distribution in synthetic diamonds
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Proceedings Volume 8338, Tenth International Conference on Correlation Optics; 83381D (2011) https://doi.org/10.1117/12.921051
Event: Correlation Optics 2011, 2011, Chernivsti, Ukraine
Abstract
In this paper we demonstrate possibilities of electron backscattering diffraction technique (Kikuchi method) for determination of strain distribution in local areas of synthetic diamond samples. To increase the precision of lattice parameter determination a correlation method and corresponding software were used for accurate identification of coordinates of Kikuchi lines intersections on the Kikuchi patterns. Consequently, subjective factors influencing on accuracy at determination of displacements of image details were minimized. Samples have been investigated by scanning electron microscope "Zeiss" EVO-50 using CCD detector. The complex analysis of location changes of Kikuchi lines intersections and Kikuchi line intensity profiles permits to specify peculiarities of strain distribution for diamonds grown by various methods.
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S. Balovsyak, M. Borcha, Ya. Garabazhiv, I. Fodchuk, V. Tkach, "Use of electron diffraction for determination of strain distribution in synthetic diamonds", Proc. SPIE 8338, Tenth International Conference on Correlation Optics, 83381D (22 November 2011); doi: 10.1117/12.921051; https://doi.org/10.1117/12.921051
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