Medical CT image reconstruction accuracy in the presence of metal objects using x-rays up to 1 MeV with x-ray targets of beryllium, carbon, aluminum, copper, and tungsten

James Clayton; Arundhuti Ganguly; Gary Virshup

doi:10.1117/12.917332

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30 March 2012 Medical CT image reconstruction accuracy in the presence of metal objects using x-rays up to 1 MeV with x-ray targets of beryllium, carbon, aluminum, copper, and tungsten

James Clayton, Arundhuti Ganguly, Gary Virshup

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Proceedings Volume 8344, Nanosensors, Biosensors, and Info-Tech Sensors and Systems 2012; 83441G (2012) https://doi.org/10.1117/12.917332
Event: SPIE Smart Structures and Materials + Nondestructive Evaluation and Health Monitoring, 2012, San Diego, California, United States

Abstract

Flat panels imagers based on amorphous silicon technology (a-Si) for digital radiography have been accepted by the medical community as having several advantages over film-based systems. Radiotherapy treatment planning systems employ computed tomographic (CT) data sets and projection images to delineate tumor targets and normal structures that are to be spared from radiation treatment. The accuracy of CT numbers is crucial for radiotherapy dose calculations. Conventional CT scanners operating at kilovoltage X-ray energies typically exhibit significant image reconstruction artifacts in the presence of metal implants in human body. Megavoltage X-ray energies have problems maintaining contrast sensitivity for the same dose as kV X-ray systems. We intend to demonstrate significant improvement in metal artifact reductions and electron density measurements using an amorphous silicon a-Si imager obtained with an X-ray source that can operate at energies up to 1 MeV. We will investigate the ability to maintain contrast sensitivity at this higher X-ray energy by using targets with lower atomic numbers and appropriate amounts of Xray filtration than are typically used as X-ray production targets and filters.

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James Clayton, Arundhuti Ganguly, and Gary Virshup "Medical CT image reconstruction accuracy in the presence of metal objects using x-rays up to 1 MeV with x-ray targets of beryllium, carbon, aluminum, copper, and tungsten", Proc. SPIE 8344, Nanosensors, Biosensors, and Info-Tech Sensors and Systems 2012, 83441G (30 March 2012); https://doi.org/10.1117/12.917332

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