Spectral Cut-Off Behaviour Of Ti:LiNbO3 And Semiconductor Waveguides: Analysis And Experiment

M. Meliga; S. Morasca; B. Sordo; C. De Bernardi

doi:10.1117/12.942361

10 March 1988 Spectral Cut-Off Behaviour Of Ti:LiNbO₃ And Semiconductor Waveguides: Analysis And Experiment

M. Meliga, S. Morasca, B. Sordo, C. De Bernardi

Proceedings Volume 0835, Integrated Optical Circuit Engineering V; (1988) https://doi.org/10.1117/12.942361
Event: Cambridge Symposium on Fiber Optics and Integrated Optoelectronics, 1987, Cambridge, MA, United States

Abstract

The spectrum of modal cut-off wavelengths is studied for waveguides with step and graded index profile. It is shown that by measuring the cut-off wavelength of supported modes it is possible to obtain values for the refractive index of the guiding layer in the step-index case, and information on the diffusion length and the best profile shape for graded-index guides. This method has been experimentally applied to InGaAsP and InGaAlAs waveguides, whose indices are obtained with accuracy to the third decimal place, in favorable comparison to other techniques, and to Ti:LiNb0₃ guides.

Citation Download Citation

M. Meliga, S. Morasca, B. Sordo, and C. De Bernardi "Spectral Cut-Off Behaviour Of Ti:LiNbO₃ And Semiconductor Waveguides: Analysis And Experiment", Proc. SPIE 0835, Integrated Optical Circuit Engineering V, (10 March 1988); https://doi.org/10.1117/12.942361

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